Titolo | Lithium diffusion in cerium-vanadium mixed oxide thin films: A systematic study |
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Tipo di pubblicazione | Articolo su Rivista peer-reviewed |
Anno di Pubblicazione | 2001 |
Autori | Varsano, F., Decker F., Masetti E., and Croce F. |
Rivista | Electrochimica Acta |
Volume | 46 |
Paginazione | 2069-2075 |
ISSN | 00134686 |
Parole chiave | Cerium compounds, Cerium vanadium mixed oxide, Conductive films, Diffusion in solids, Intercalation compounds, Ionic conduction in solids, Lithium, Oxides, Spectroscopic analysis |
Abstract | Three electroanalytical techniques have been used to study the solid-state ionic diffusion of lithium into cerium-vanadium mixed oxide thin films, i.e. potentiostatic intermittent titration technique, galvanostatic intermittent titration technique and electrochemical impedance spectroscopy. Diffusion coefficients measured with the above mentioned techniques show a non-monotonic decay between 8 × 10-12 and 8 × 10-14 cm2s-1. In particular, lithium diffusion coefficient drops by more than one order of magnitude at lithium intercalation degree x = 0.6. This abrupt change seems to be related to a dramatic increase of the material resistance suggesting that the limiting factor in atomic lithium diffusion may be the low electronic conductivity. © 2001 Elsevier Science Ltd. |
Note | cited By 39 |
URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0035794635&doi=10.1016%2fS0013-4686%2801%2900408-X&partnerID=40&md5=dee99b6fa2b6a1dd1ef321e6daeb6248 |
DOI | 10.1016/S0013-4686(01)00408-X |
Citation Key | Varsano20012069 |