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Lithium diffusion in cerium-vanadium mixed oxide thin films: A systematic study

TitleLithium diffusion in cerium-vanadium mixed oxide thin films: A systematic study
Publication TypeArticolo su Rivista peer-reviewed
Year of Publication2001
AuthorsVarsano, F., Decker F., Masetti E., and Croce F.
JournalElectrochimica Acta
Volume46
Pagination2069-2075
ISSN00134686
KeywordsCerium compounds, Cerium vanadium mixed oxide, Conductive films, Diffusion in solids, Intercalation compounds, Ionic conduction in solids, Lithium, Oxides, Spectroscopic analysis
Abstract

Three electroanalytical techniques have been used to study the solid-state ionic diffusion of lithium into cerium-vanadium mixed oxide thin films, i.e. potentiostatic intermittent titration technique, galvanostatic intermittent titration technique and electrochemical impedance spectroscopy. Diffusion coefficients measured with the above mentioned techniques show a non-monotonic decay between 8 × 10-12 and 8 × 10-14 cm2s-1. In particular, lithium diffusion coefficient drops by more than one order of magnitude at lithium intercalation degree x = 0.6. This abrupt change seems to be related to a dramatic increase of the material resistance suggesting that the limiting factor in atomic lithium diffusion may be the low electronic conductivity. © 2001 Elsevier Science Ltd.

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URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-0035794635&doi=10.1016%2fS0013-4686%2801%2900408-X&partnerID=40&md5=dee99b6fa2b6a1dd1ef321e6daeb6248
DOI10.1016/S0013-4686(01)00408-X
Citation KeyVarsano20012069