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Protective coating from manganese cobalt oxide powders obtained by high energy ball milling: Materials characterization and cell environment testing

TitoloProtective coating from manganese cobalt oxide powders obtained by high energy ball milling: Materials characterization and cell environment testing
Tipo di pubblicazionePresentazione a Congresso
Anno di Pubblicazione2015
AutoriMasi, A., Bellusci M., Carlini M., McPhail S., Pumiglia D., Reale P., Rinaldi Antonio, and Padella F.
Conference NameECS Transactions
EditoreElectrochemical Society Inc.
Parole chiaveArea-specific resistances, Ball milling, Ceramic coatings, Cobalt compounds, Cost effectiveness, Environmental friendly approach, Fuel storage, High-energy ball milling, Manganese, Manganese oxide, Manganese-cobalt oxides, Materials characterization, Materials testing, Mechano-chemical powder, Milling (machining), Oxidizing environments, Powder coatings, Powders, Protective coatings, Scanning electron microscopy, Sintering, Solid oxide fuel cells (SOFC), Stainless steel, Stainless steel substrates, X ray diffraction
Abstract

The required application of ceramic coatings on metallic interconnects to avoid corrosion in SOFC oxidizing environment has pointed out the need to find cheap and environmental friendly approaches for the production of coating powders, to be applied by diffused and cost effective wet powder processing techniques like spray and slurry coating methods. High Energy Ball Milling (HEBM) is a mechanochemical powder processing technique here exploited to produce mixed composition coating precursor powders from Mn and Co oxides. The processed compound consists of nanostructured and intimately mixed Mn-Co oxides that rapidly react to produce the high temperature spinel phase during the sintering process. A slurry suspension was formulated and applied on a stainless steel substrate, evaluating the coating behaviour during 500h oxidation test at 800°C by means of Area Specific Resistance (ASR) evolution, X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) analyses. © The Electrochemical Society.

URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84938787707&doi=10.1149%2f06801.2671ecst&partnerID=40&md5=3020239e507129a6e8b3dee876cfab6c
DOI10.1149/06801.2671ecst
Citation KeyMasi20152671