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Microstructural characterization of SiC-SiC joint by Raman spectroscopy

TitoloMicrostructural characterization of SiC-SiC joint by Raman spectroscopy
Tipo di pubblicazioneArticolo su Rivista peer-reviewed
Anno di Pubblicazione2004
AutoriMagnani, G., Brillante A., Farina L., and Beaulardi L.
RivistaJournal of the American Ceramic Society
Volume87
Paginazione651-655
ISSN00027820
Parole chiaveBrazing, Composition, Crystal growth, Crystal microstructure, Crystal structure, Crystal symmetry, Crystallization, Density (specific gravity), Mixtures, Neutral density filters, Phase transitions, Raman microspectrometers, Raman spectroscopy, Scanning electron microscopy, Silicon carbide
Abstract

Analysis of the SiC-SiC joint and its brazing mixture has been performed using a Raman spectroscopy microprobe technique. A careful mapping of the sample clearly shows the spatial distribution of the chemical species close to and within the joint. A different distribution of the 4H and 6H α-SiC polytypes, grown during the brazing process, was observed inside the joint. The furthermore, identification of the bands related to the Nowotny phase was also possible.

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cited By 1

URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-2342504588&partnerID=40&md5=30a2c5b9323d69f8a87e273a11e42418
Citation KeyMagnani2004651