Titolo | Laser-induced damage thresholds of SiO2 films grown with different assistance parameters: a comparative study performed by the photoacoustic mirage technique |
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Tipo di pubblicazione | Presentazione a Congresso |
Anno di Pubblicazione | 1998 |
Autori | Alvisi, Marco, De Nunzio G., Perrone M.R., Rizzo Antonella, Scaglione S., and Vasanelli L. |
Conference Name | Conference on Lasers and Electro-Optics Europe - Technical Digest |
Editore | IEEE, Piscataway, NJ, United States |
Conference Location | Glasgow, Scotland |
Parole chiave | Acoustooptical effects, Coatings, Fabrication, Film growth, Fused silica, Helium neon lasers, Ion beams, Laser damage, Light transmission, Mirrors, Photoacoustic mirage technique, Pulsed laser applications, Refractive index, Thin films |
Abstract | The dual ion beam sputtering technique has been used to grow SiO2 thin films on fused silica substrates. The role of some deposition parameters on the coating laser-induced damage threshold (LIDT) has been investigated. Results indicate that a proper choice of the assisting-ion-beam parameters allows to optimize the coating quality and to increase its damage threshold. |
URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0031625338&partnerID=40&md5=6a26049a4c5f7560d0b9b53f1546f137 |
Citation Key | Alvisi1998311 |