Dipartimento Sostenibilità, circolarità e adattamento al cambiamento climatico dei Sistemi Produttivi e Territoriali

Found 2 results

Filtri: Autore is Quirini, A. and Parola Chiave is Semiconducting films [Clear All Filters]

1999

Characterisation of ZnS:Mn thin films by Rietveld refinement of Bragg-Brentano X-ray diffraction patterns, Tagliente, M.A., Penza Michele, Gusso M., and Quirini A. , Thin Solid Films, Volume 353, Number 1, p.129-136, (1999)

Characterization of transparent and conductive electrodes of indium tin oxide thin films by sequential reactive evaporation, Penza, Michele, Cozzi S., Tagliente M.A., Mirenghi L., Martucci C., and Quirini A. , Thin Solid Films, Volume 349, Number 1, p.71-77, (1999)