| Title | Optical characterization of cerium-vanadium mixed oxide films for electrochromic devices |
|---|---|
| Publication Type | Presentazione a Congresso |
| Year of Publication | 1999 |
| Authors | Varsano, F., Krasilnikova A., Decker F., and Masetti E. |
| Conference Name | Proceedings of SPIE - The International Society for Optical Engineering |
| Conference Location | Berlin, Ger |
| Keywords | Cerium compounds, Cerium dioxide, Electrochromism, Intercalation compounds, Optical coatings, Optical films, Partial pressure, Sputter deposition, Thin films, Vanadium compounds, Vanadium pentoxide |
| Abstract | Films of Ce-V mixed oxide were deposited by reactive r.f. sputtering from a target of cold pressed CeO2 and V2O5 mixed powders. Optical and ion storage properties of the films have been studied in function of the oxygen partial pressure inside the sputtering chamber during the deposition process. Li intercalation was accomplished electrochemically. Optical constants have been determined for as-deposited and intercalated films. |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032655347&partnerID=40&md5=68e349c9d64c8425e13a04f3a8c233b3 |
| Citation Key | Varsano199997 |
