Characterization of MoS2:Nb sputtered thin films. An application as hole transport layer in Cu2ZnSnS4/Si tandem solar cells, Malerba, C., Valentini M., Menchini F., Mirabile Gattia Daniele, Salza E., and Mittiga A. , Thin Solid Films, Volume 806, (2024)

Analysis of data from various indentation techniques for thin films intrinsic hardness modelling, Chicot, D., Bemporad E., Galtieri G., Roudet F., Alvisi Marco, and Lesage J. , Thin Solid Films, Volume 516, Number 8, p.1964-1971, (2008)

RF sputtering deposition of alternate TiN/ZrN multilayer hard coatings, Rizzo, Antonella, Signore M.A., Penza Michele, Tagliente M.A., De Riccardis Maria Federica, and Serra Emanuele , Thin Solid Films, Volume 515, Number 2 SPEC. ISS., p.500-504, (2006)

On the influence of carbon implantation on the structural properties of hard TiN coatings studied by glancing incidence X-ray diffraction, Tagliente, M.A., Falcone R., Mello D., Esposito C., and Tapfer Leander , Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volume 179, Number 1, p.42-54, (2001)

X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates, Alvisi, Marco, Rizzo Antonella, Tapfer Leander, and Vasanelli L. , Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)