Produzione Scientifica
Found 2 results
Filters: Author is Vasanelli, L. and Keyword is X ray reflectivity [Clear All Filters]
Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy,
, Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)
X-ray reflectivity analysis of thin TiN and TiOxNy films deposited by dual-ion-beam sputtering on (100) Si substrates,
, Thin Solid Films, Volume 298, Number 1-2, p.130-134, (1997)