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Produzione Scientifica

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Filters: Author is Leo, G. and Keyword is X ray reflectivity  [Clear All Filters]
1998
Surface and interface morphology of thin oxide films investigated by X-ray reflectivity and atomic force microscopy, Alvisi, Marco, Leo G., Rizzo Antonella, Tapfer Leander, and Vasanelli L. , Surface and Coatings Technology, Volume 100-101, Number 1-3, p.76-79, (1998)